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MFP-3D Atomic Force Microscope Z-axis Extension Head

40μm Z-range extension head. AFM head for rough shape applications.

We have developed a new type of MFP-3D extension head for use with the MFP-3D atomic force microscope (AFM/SPM) system. It provides a range of 40 μm in the Z direction for imaging tall samples and long-range force measurements, minimizing degradation of imaging performance (atomic resolution can also be achieved).